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        Effective medium investigation of thin film niobium nitrides 

        Zukosky, Patrick A. (Northern Illinois University, 1986)
        The purpose of this study is to relate the dielectric constant data of thin film samples of superconducting niobium nitride to the structural properties of the films. A rotating analyzer ellipsometer was used to measure ...

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        AuthorZukosky, Patrick A. (1)SubjectDielectric films (1)Dielectrics (1)Niobium nitride (1)
        Superconductivity (1)
        Thin films (1)... View MoreDate Issued
        1986 (1)
        Has File(s)Yes (1)

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