Effective medium investigation of thin film niobium nitrides
Zukosky, Patrick A.
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The purpose of this study is to relate the dielectric constant data of thin film samples of superconducting niobium nitride to the structural properties of the films. A rotating analyzer ellipsometer was used to measure the complex dielectric constant of four thin film samples of superconducting niobium Nitride over the 1.9 to 3.5 eV energy range. Each sample was produced by using a different growth rate, thereby also yielding different dielectric constant spectra. The corresponding structural properties of each sample were approximated by using an effective medium theory to relate the dielectric constant data to the structural properties. The superconducting transition temperature of each of the samples was measured by other researchers, thus presenting an independent measure of structural properties. It was found that the structural properties as determined optically correlated with the structural properties as determined by superconductivity measurements.