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dc.contributor.authorLurio, Laurence
dc.contributor.authorMukhopadhyay, M.K.
dc.contributor.authorJiang, Z.
dc.contributor.authorJiao, X.
dc.contributor.authorSprung, Michael
dc.contributor.authorDeCaro, Curt
dc.contributor.authorSinha, S.K.
dc.date.accessioned2013-06-19T19:23:22Z
dc.date.available2013-06-19T19:23:22Z
dc.date.issued2010
dc.identifier.citationM.K. Mukhopadhyay, L.B. Lurio, Z. Jiang, X. Jiao, M. Sprung, C DeCaro and S.K. Sinha, "Measurement of the interior structure of a thin polymer film using grazing incidence diffuse x-ray scattering" Phys. Rev. E 82, 011804 (2010)en_US
dc.identifier.issn1539-3755
dc.identifier.urihttp://commons.lib.niu.edu/handle/10843/13528
dc.identifier.urihttp://hdl.handle.net/10843/13528
dc.description.abstractA method is developed for calculating the small-angle x-ray scattering originating from within the interior of a thin film under grazing incidence illumination. This offers the possibility of using x-ray scattering to probe how the structure of polymers is modified by confinement. When the diffuse scattering from a thin film is measured over a range of incident angles, it is possible to separate the contributions to scattering from the interfaces and the contribution from the film interior. Using the distorted-wave Born approximation the structure factor, S q , of the film interior can then be obtained. We apply this method to analyze density fluctuations from within the interior of a silicon supported molten polystyrene PS film. Measurements were made as a function of film thickness ranging from one to ten times the polymer radius of gyration Rg . The compressibility, calculated by extrapolating the measured S q to q=0, agrees well with that of bulk PS for thick films, but thinner films exhibit a peak in S q near q=0. This peak, which grows with decreasing thickness, is attributed to a decreased interpenetration of chains and a consequent enhanced compressibility.en_US
dc.description.sponsorshipThis work is supported by NSF Grant No. DMR-0209542. Use of the Advanced Photon Source at Argonne National Laboratory was supported by U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under DOE Contract No. DE-AC02-06CH11357.en_US
dc.language.isoen_USen_US
dc.publisherAmerican Physical Societyen_US
dc.titleMeasurement of the Interior Structure of Thin Polymer Films Using Grazing Incidence Diffuse X-Ray Scatteringen_US
dc.typeArticleen_US
dc.altlocation.urihttp://dx.doi.org/10.1103/PhysRevE.82.011804en_US
dc.contributor.departmentDepartment of Physics


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