Now showing items 1-2 of 2
Measurement of the Interior Structure of Thin Polymer Films Using Grazing Incidence Diffuse X-Ray Scattering
(American Physical Society, 2010)
A method is developed for calculating the small-angle x-ray scattering originating from within the interior of a thin film under grazing incidence illumination. This offers the possibility of using x-ray scattering to ...
Thickness Induced Structural Changes in Polystyrene Films
(American Physical Society, 2008)
Changes to the structure of polystyrene melt films as measured through the spectrum of density fluctuations have been observed as a function of film thickness down to the polymer radius of gyration (Rg). Films thicker ...